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ATC FIB/SEM Expands Capabilities To The Nano Scale Level

Dualbeam™ FIB/SEM

ATC’s Scios 2 DualBeam Laboratory

ATC introduced its new Dualbeam™ FIB/SEM capability today, accompanied by a staff with 30 years in FIB/SEM analysis and sample preparation. This new capability enhances the ATC position as a leader in Failure Analysis (FA), Destructive Physical Analysis (DPA), Prohibited Material Analysis (PMA) and Real Time ,3-D, Color X-Ray services.

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